Counting for Random Testing
نویسنده
چکیده
The seminal works of Wilf and Nijenhuis in the late 70s have led to efficient algorithms for counting and generating uniformly at random a variety of combinatorial structures. In 1994, Flajolet, Zimmermann and Van Cutsem have widely generalised and systematised the approach. This extended abstract presents several applications of these powerful results to software random testing, and random model exploration.
منابع مشابه
Counting Two-State Transition-Tour Sequences
This paper develops a closed-form formula, f ( k ), to count the number of transition-tour sequences of length k for bistable machines. It is shown that the function f ( k ) is related to Fibonacci numbers. Some applications of the results in this paper are in the areas of: testable sequential machine designs, random testing of register data paths, and qualification tests for random pattern gen...
متن کاملHeuristics for Fast Exact Model Counting
An important extension of satisfiability testing is model-counting, a task that corresponds to problems such as probabilistic reasoning and computing the permanent of a Boolean matrix. We recently introduced Cachet, an exact model-counting algorithm that combines formula caching, clause learning, and component analysis. This paper reports on experiments with various techniques for improving the...
متن کاملDesign of Accelerated Life Testing Plans for Products Exposed to Random Usage
< p>Accelerated Life Testing (ALT) is very important in evaluating the reliability of highly reliable products. According to ALT procedure, products undergo higher stress levels than normal conditions to reduce the failure times. ALTs have been studied for various conditions and stresses. In addition to common stress such as temperature and humidity, random usage can also be considered as anoth...
متن کاملLow Power March Memory Test Algorithm for Static Random Access Memories (TECHNICAL NOTE)
Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...
متن کاملUniversité Paris Sud – LRI 06 / 2010
This article presents optimizations of a randomized method that generates paths while ensuring a good coverage of the model, regardless its topology. The optimizations aim at diminishing the required memory, thus allowing the generation of longer paths. Pure random exploration generally leads to a bad coverage of the model. Methods, based on counting and uniform drawing in combinatorial structu...
متن کامل